|
by: Emilio Segre
publisher: Dover Publications, published: 2007-06-05
ASIN: 0486457834
EAN: 9780486457833
sales rank: 804445
A Nobel Laureate offers impressions and recollections of the development of modern physics. Rather than a chronological approach, Segrè emphasizes interesting, complex personalities who often appear only in footnotes. Readers will find that this book adds considerably to their understanding of science and includes compelling topics of current interest. 1980 edition.
|
|
by: Ron Jenkins
publisher: Wiley-Interscience, published: 1996-06-28
ASIN: 0471513393
EAN: 9780471513391
sales rank: 790493
When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity.
Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation.
The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis.
While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material.
Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry.
X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years.
This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations
Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.
|
|
by: Dennis Sherwood
publisher: Oxford University Press, USA, published: 2010-12-30
ASIN: 019955904X
EAN: 9780199559046
sales rank: 985277
A complete account of the theory of the diffraction of x-rays by crystals with particular reference to the processes of determining the structures of protein molecules, this book is aimed primarily at structural biologists and biochemists but will also be valuable to those entering the field with a background in physical sciences or chemistry. It may be used at any post-school level, and develops from first principles all relevant mathematics, diffraction and wave theory, assuming no mathematical knowledge beyond integral calculus.
The book covers a host of important topics in the area, including: - The practical aspects of sample preparation and x-ray data collection, using both laboratory and synchrotron sources - Data analysis at both theoretical and practical levels - The important role played by the Patterson function in structure analysis by both molecular replacement and experimental phasing approaches - Methods for improving the resulting electron density map - The theoretical basis of methods used in refinement of protein crystal structures - In-depth explanation of the crucial task of defining the binding sites of ligands and drug molecules - The complementary roles of other diffraction methods which reveal further detail of great functional importance in a crystal structure.
|
|
by: Alexander J Blake
publisher: Oxford University Press, USA, published: 2009-08-31
ASIN: 0199219478
EAN: 9780199219476
sales rank: 1738714
This text focuses on the practical aspects of crystal structure analysis, and provides the necessary conceptual framework for understanding and applying the technique. By choosing an approach that does not put too much emphasis on the mathematics involved, the book gives practical advice on topics such as growing crystals, solving and refining structures, and understanding and using the results. The technique described is a core experimental method in modern structural chemistry, and plays an ever more important role in the careers of graduate students, postdoctoral and academic staff in chemistry, and final-year undergraduates. Much of the material of the first edition has been significantly updated and expanded, and some new topics have been added. The approach to several of the topics has changed, reflecting the book's new authorship, and recent developments in the subject.
|
|
by: David Attwood
publisher: Cambridge University Press, published: 2007-03-05
ASIN: 052102997X
EAN: 9780521029971
sales rank: 1167473
This self-contained, comprehensive book describes the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft x-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include EUV lithography, biomicroscopy, spectromicroscopy, EUV astronomy, synchrotron radiation, and soft x-ray lasers. He also provides a great deal of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practicing engineers involved in semiconductor fabrication and materials science.
|
|
by: Li-ling Ooi
publisher: Oxford University Press, USA, published: 2010-05-02
ASIN: 0199569045
EAN: 9780199569045
sales rank: 1429667
X-ray crystallography has long been a powerful tool in the elucidation of the three-dimensional structures of small molecules and macromolecules. However, despite its power, it is a technically challenging subject that those new to the technique often find daunting.
An ideal primer for students encountering the technique for the first time, Principles of X-ray Crystallography provides a clear, succinct guide to the three-dimensional world of molecules. Featuring a lucid and direct writing style, real-life examples, diagrams, exercises, and activities, this unique text engages students in visualizing three-dimensional structures, rather than overwhelming them with excessive detail. Author Li-ling Ooi explores both the theoretical principles on which the technique is based and the practice of gathering and analyzing crystallographic data, offering a balanced, well-rounded account of the field. Drawing on valuable teaching experience, Ooi employs a tutorial approach--including self-test exercises and hands-on activities--that leads students through key concepts in a carefully structured and evenly paced manner.
The text encompasses aspects of both small molecule and macromolecular crystallography, highlighting the similarities and differences between the two. A companion website features resources for students--a library of annotated web links and data sets related to topics discussed in the book--and instructors--downloadable figures from the book in electronic format and PowerPoint slide sets for each chapter.
|
|
by: Yoshio Waseda
publisher: Springer, published: 2011-03-08
ASIN: 3642166342
EAN: 9783642166341
sales rank: 1678046
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
|
|
by: Jan Drenth
publisher: Springer, published: 2006-11-09
ASIN: 0387333347
EAN: 9780387333342
sales rank: 1456994
X-ray crystallography is an established method for studying the structure of proteins and other macromolecules. As the importance of proteins grows, researchers in many fields have found that a working knowledge of X-ray diffraction is an indispensable tool. In this new edition of his essential work, the internationally recognized researcher Dr. Jan Drenth offers an up-to-date and technically rigorous introduction to the subject, providing the theoretical background necessary to understand how the structure of proteins is determined at atomic resolution. New material in the 3rd edition includes a section on twinning, an additional chapter on crystal growth and a discussion of single-wavelength anomalous dispersion.
|
|
by: Alexander McPherson
publisher: Wiley-Blackwell, published: 2009-02-03
ASIN: 0470185902
EAN: 9780470185902
sales rank: 1578684
A comprehensive and approachable introduction to crystallography — now updated in a valuable new editionThe Second Edition of this well-received book continues to offer the most concise, authoritative, and easy-to-follow introduction to the field of crystallography. Dedicated to providing a complete, basic presentation of the subject that does not assume a background in physics or math, the book's content flows logically from basic principles to methods, such as those for solving phase problems, interpretation of Patterson maps and the difference Fourier method, the fundamental theory of diffraction and the properties of crystals, and applications in determining macromolecular structure. This new edition includes a vast amount of carefully updated materials, as well as two completely new chapters on recording and compiling X-ray data and growing crystals of proteins and other macromolecules. Richly illustrated throughout to clarify difficult concepts, this book takes a non-technical approach to crystallography that is ideal for professionals and graduate students in structural biology, biophysics, biochemistry, and molecular biology who are studying the subject for the first time.
|
|
by: Jocelyn E. Krebs
publisher: Jones & Bartlett Publishers, published: 2009-12-07
ASIN: 0763766321
EAN: 9780763766320
sales rank: 189318
The field of molecular biology and molecular genetics is rapidly changing with new data acquired daily and new insights into well-studied processes presented on a scale of weeks or months rather than years. For decades Lewin's GENES has provided the teaching community with the most cutting edge presentation of molecular biology and molecular genetics, covering gene structure, sequencing, organization, and expression. The latest edition, with a knowledgeable new author team, has enlisted 21 scientists to provide revisions and content updates in their individual fields of expertise, ensuring that Lewin's GENES X is the most current and comprehensive text in the field. Informative new chapters, as well as a reorganization of material, provide a more logical flow of topics and many chapters have been renamed to better indicate their contents. Lewin's GENES X also contains new pedagogical features to help students learn as they read and an online student study guide allows students to test themselves on key material.
|