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publisher: Springer, published: 2011-03-22
ASIN: 1441971998
EAN: 9781441971999
sales rank: 1024393
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
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by: Joachim Frank
publisher: Oxford University Press, USA, published: 2006-02-02
ASIN: 0195182189
EAN: 9780195182187
sales rank: 946121
Cryoelectron microscopy of biological molecules is among the hottest growth areas in biophysics and structural biology at present, and Frank is arguably the most distinguished practitioner of this art. CryoEM is likely over the next few years to take over much of the structural approaches currently requiring X-ray crystallography, because one can now get good and finely detailed images of single molecules down to as little as 200,000 MW, covering a substantial share of the molecules of greatest biomedical research interest. This book, the successor to an earlier work published in 1996 with Academic Press, is a natural companion work to our forthcoming book on electron crystallography by Robert Glaeser, with contributions by six others, including Frank. A growing number of workers will employ CryoEM for structural studies in their own research, and a large proportion of biomedical researchers will have a growing interest in understanding what the capabilities and limits of this approach are.
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by: Orlando Castejón
publisher: Springer, published: 2003-06-30
ASIN: 0306477114
EAN: 9780306477119
sales rank: 1356117
In a clear exposition this inspirational book shows the in situ three-dimensional morphology of cerebellar neurons, intracortical circuits and synaptic connections that underpin the functioning of cerebellar neurons in networks. It brings together in one volume a new view of the three-dimensional cytoarchitectonic arrangement of the cerebellar cortex. The book shows the cerebellar extrinsic and intrinsic intracortical circuits formed by mossy and climbing fibers as exposed by the cryofracture methods. The high degree of lateral collateralization of these fibers is also displayed providing new insights on the information processing in the cerebellar cortex. Besides, field emission high resolution electron microscopy shows its potential contribution to the study of synaptic morphology. The concluding chapter deals with the contribution of scanning electron microscopy to cerebellar neurobiology. This monograph is an authoritative survey and a must for anyone who is interested in the structure of the central nervous system. It will also appeal to an interdisciplinary audience who wants to learn more about electron microscopy and neurocytology.
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by: Peter J. Goodhew
publisher: Taylor & Francis, published: 2000-11-30
ASIN: 0748409688
EAN: 9780748409686
sales rank: 1221957
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
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by: Elaine Evelyn Hunter
publisher: Cambridge University Press, published: 1993-09-24
ASIN: 0521385393
EAN: 9780521385398
sales rank: 1384184
This is an extensively illustrated laboratory manual of transmission electron microscopy techniques for the laboratory technician, graduate student, or researcher. Chapters begin with a general discussion, move on to the chemicals and equipment required for the method being described and conclude with a step-by-step presentation of the method and instructions for the preparation of solutions. Notes at the end of each chapter warn of possible pitfalls and outline "tricks of the trade". The methods and techniques outlined have been tested for over ten years in clinical and research laboratory situations, and are entirely reliable. Practical Electron Microscopy covers fixation, dehydration and embedding, semithin and thin sectioning, the electron microscope, and photography. For this new edition, the chapters on photography and the electron microscope have been completely rewritten and two new chapters have been added, one on immunoelectron microscopy using colloidal gold, and one dealing with such special techniques as retrieving specimens from paraffin and handling nasal brushings and blood samples.
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by: Nicolas Rasmussen
publisher: Stanford University Press, published: 1999-08-01
ASIN: 0804738505
EAN: 9780804738507
sales rank: 668321
Two major questions motivate this study: How do new devices get taken up as experimental systems by scientists? How does the adoption of new instruments affect scientific knowledge? Many ramifications emerge from these two simple questions. Among these are historical questions about how, by whom, and why new instruments are introduced, or about how another, different set of instruments might be adopted given alternative social and cultural circumstances. Philosophical questions include the ways in which scientific understanding of the world depends on scientists’ instruments and techniques. Sociological questions concern such issues as how the organization of work within disciplines and laboratories and other scientific institutions may depend on the equipment employed.
All these questions are addressed in this book, which draws upon a range of archival sources as well as published scientific literature, through a detailed historical treatment of the electron microscope’s introduction and early impact on the life sciences. The author first describes the introduction of the electron microscope during the World War II years, and then traces its influence on the subsequent divergence of several life sciences research traditions, including what came to constitute cell biology. The historical evidence is discussed in the light of recent discussions on the origin and nature of molecular biology, the importance of new instruments in the postwar life sciences, and the nature of research traditions, among other issues.
Building on the pragmatist tradition, the author also advances an original philosophical argument on the relation of experimental technology to scientific change, arguing that matters of scientific fact (and also matters of the social organization of science) are only settled through agreement on standardized methods of inquiry.”
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by: Augus I. Kirkland
publisher: World Scientific Publishing Company, published: 2012-08-30
ASIN: 1848162855
EAN: 9781848162853
sales rank: 5724087
Electron microscopes are used in most investigation methods in materials science and are key players in the rise of nanotechnology. As the limits of electron microscopy are being pushed by the development of much-improved electron sources and electron optics, the attention of the electron microscopy community is turning towards imaging electron detectors, but the literature on this complex field is limited and extremely fragmented. This book provides a comprehensive introduction to electron detectors, bringing together the most important achievements and highlighting the most important advances. It discusses theoretical, technological and functional aspects of electron detectors, building a natural progression through the main concepts in detection as well as providing an excellent resource for teaching and for new researchers in electron microscopy. The book also presents a critical outline of the new generation of electron detectors, which highlights the latest breakthroughs and illustrates how these will further push the limits of electron microscopy.
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by: Douglas B. Murphy
publisher: Wiley-Liss, published: 2001-12-15
ASIN: 047125391X
EAN: 9780471253914
sales rank: 336320
Over the last decade, advances in science and technology have profoundly changed the face of light microscopy. Research scientists need to learn new skills in order to use a modern research microscope–skills such as how to align microscope optics and perform image processing. Fundamentals of Light Microscopy and Electronic Imaging explores the basics of microscope design and use. The comprehensive material discusses the optical principles involved in diffraction and image formation in the light microscope, the basic modes of light microscopy, the components of modern electronic imaging systems, and the image processing operations necessary to acquire and prepare an image.Written in a practical, accessible style, Fundamentals of Light Microscopy and Electronic Imaging reviews such topics as: - Illuminators, filters, and isolation of specific wavelengths
- Phase contrast and differential interference contrast
- Properties of polarized light and polarization microscopy
- Fluorescence and confocal laser scanning microscopy
- Digital CCD microscopy and image processing
Each chapter includes practical demonstrations and exercises along with a discussion of the relevant material. In addition, a thorough glossary assists with complex terminology and an appendix contains lists of materials, procedures for specimen preparation, and answers to questions. An essential resource for both, experienced and novice microscopists.
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by: Richard G. Kessel
publisher: W.H.Freeman & Co Ltd, published: 1979-06
ASIN: 0716700913
EAN: 9780716700913
sales rank: 1455034
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by: Michael Loretto
publisher: Chapman & Hall, published: 1994-01-01
ASIN: 0412477904
EAN: 9780412477904
sales rank: 1352476
The second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis available today.
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